英文摘要 |
In this study, RF sputtering was used to deposit a TiO_2 film on an ITO glass substrate as a compact layer on a dye-sensitized solar cell (DSCC) to avoid charge recombination caused by contact between the ITO glass and the electrolyte. When the thickness of the compact layer was 24 nm, the adhesion of porous TiO_2 on the ITO glass substrate and interface transfer resistance (R_2) obtained through EIS measurement improved. A low R_2 value indicates an improvement in the charge transfer process of electrons in the DSSC with the following photovoltaic characteristics: short circuit current density (Jsc) = 13.10 mA/cm^2, open circuit voltage (Voc) = 0.70 V, fill factor (FF) = 54.37%, and light to electricity conversion efficiency (η) = 5.02%. Compared with the DSSC without the TiO_2 compact layer, adding the TiO_2 compact layer to the DSSC increased the photoelectric conversion efficiency from 4.63% to 5.02%. Thus, the sputtering TiO_2 compact layer can effectively improve the properties of the DSSC device. |