| 英文摘要 |
As semiconductor devices continue to evolve toward high-density integration, high-performance computing, and low-power operation, conventional thin-film deposition technologies are increasingly challenged by thickness control, interface quality, and conformal coating capability in nanoscale and three-dimensional structures. Under these circumstances, Atomic Layer Deposition (ALD), featuring atomic-scale thickness control, excellent uniformity, superior step coverage, and low-temperature deposition capability, has become one of the key enabling technologies in advanced semiconductor manufacturing. This article reviews the applications and recent developments of ALD in advanced semiconductor technologies, including advanced logic devices, three-dimensional NAND flash memory, back-end-of-line interconnects, advanced packaging, and two-dimensional material-based devices. The critical roles of ALD in high-k gate dielectrics, metal gates, barrier layers, and interface engineering are also discussed. In addition, as advanced semiconductor manufacturing becomes increasingly sensitive to contamination and yield degradation, the role of ALD in ultra-clean processing has attracted growing attention. This review further discusses plasma-induced chamber degradation and particle contamination mechanisms, as well as the potential of Y₂O₃protective coatings combined with high-density ALD thin films for reducing particle generation and improving chamber stability. Finally, future development trends of ALD technologies, including low-temperature ALD, area-selective ALD, ultra-clean processing, and intelligent process control, are presented. Overall, ALD has evolved from a conventional thin-film deposition technique into a critical platform technology for next-generation semiconductor manufacturing, heterogeneous integration, and ultra-clean processing. |