| 英文摘要 |
Coping process under test stress was assumed to contain two components: (1) the tendency toward information processing: attending to test information, handling difficult information needed for processing; (2) the tendency toward self-evaluation: appraising the threatened information about self while processing. These two components was measured at 4 days: 10 days, 5 days, 1 day before exam, and the day before the next exam. 124 college students as subjects, their somatic anxiety, depressive mood and coping cognition were measured at those 4 days. The results found that negative appraisal about self was the most important variable covariated with test emotionality, but information processing factor did not have a substantial relationship with test emotionality along temporal variable. A hypothetical model was presented that, during test stress, information processing and self-appraisal were two relatively independent processes, the former was related to situational demands, and the latter was related to internal stable factor which would be the major possible source of test emotionality. |