同步輻射X光奈米探針技術應用於奈米級別材料之螢光光譜與吸收分析技術

Application of Synchrotron X-ray Nanoprobe Technology for Nanomaterials using Fluorescence Spectroscopy and Absorption Analysis

X光激發放光光譜學(X-ray excited optical luminescence, XEOL)是現今對於物質原子分佈研究十分重要的一門技術。TPS 23A X光奈米探測(X-ray Nanoprobe, XNP)光束線為台灣光子源(Taiwan Photon Source, TPS)針對高空間解析需求所設計的實驗站，用以解析現代先進奈米材料或是園子分佈較為複雜材料之原子、化學和電子結構。非破壞性X光光源經強聚焦得以提供約60奈米空間解析度，對於諸如奈米半導體元件、能源材料與發光元件、奈米生醫材料等我國積極推動的尖端科技研究提供高品質分析環境與多功能整合分析平台。提供的實驗技術包含X光激發放光光譜(X-ray excited optical luminescence, XEOL)、時間解析X光激發放光光譜(Time-resolved XEOL, TR-XEOL)、X光螢光光譜學(X-ray fluorescence, XRF)和X光吸收光譜學(X-ray absorption spectroscopy, XAS)。

X-ray excited optical luminescence (XEOL) is an essential technology for studying the atomic distribution of matter today. The TPS 23A X-ray Nanoprobe (XNP) beamline is an experimental station designed by Taiwan Photon Source (TPS) to meet the needs of high spatial resolution. It analyzes the atomic, chemical, and electronic structures of advanced nanomaterials or materials with more complex particle distribution. The non-destructive X-ray light source is firmly focused on providing a spatial resolution of about 60 nanometers, providing a high-quality analysis environment and a multifunctional integrated analysis platform for cutting-edge technology research that our country is actively promoting, such as nano-semiconductor components, energy materials and light-emitting components, and nano-biomedical materials. The experimental techniques provided include X-ray excited optical luminescence (XEOL), time-resolved XEOL (TR-XEOL), X-ray fluorescence (XRF), and X-ray absorption spectroscopy (XAS)