英文摘要 |
The reliability for some devices with few or no failures in their life tests becomes very hard to access if a traditional life test which records only time-to-failure was utilized. To solve this problem, the analysis of the over time degradation processes is always considered in the practical cases. In this paper, a degradation model was constructed by hierarchical Bayesian approach to represent the realization of the degradation processes. Based on the developed model, the failure times and the time-to-failure distribution can be estimated. For finding the appropriate estimates of model’s parameters, the Markov Chain Monte Carlo (MCMC) algorithm is applied. A fatigue crack growth data is used as an example for illustrating the modeling procedure. By specifying the coefficients, we successfully identify the heterogeneity varying across individual products. Moreover, the time-to-failure distribution is further estimated and the reliability bounds were constructed. |