累和管制圖應用於積層陶瓷電容製程中具覆蓋性電極印刷之微量偏移製程管制探討

Studies of CUSUM Control Chart Applied in Masked Electrode Printing Inspection and Process Control in Multi-Layer Ceramic Capacitor Manufacturing Process

近年來電子產品之元件為因應下游產品輕、薄、短、小的趨勢，已逐漸由晶元型元件取代了傳統形元件。