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| 201612 (209期)期所有篇 |
- 奈米檢測技術應用 Applications of Nano-inspection Technologies
- 掃描微波阻抗顯微鏡：介電常數與電導率的奈米級成像 Scanning Microwave Impedance Microscope: Nanoscale Mapping of Permittivity and Conductivity
- 三維原子探針簡介 Three-Dimensional Atom Probe
- 應用同步輻射硬X光研究奈米材料 The Applications of Hard X-ray Synchrotron Radiation in Nano-Material Researches
- 利用半導體儀器設備技術發展二維電子通道材料元件製程近況 The Investigation of 2D Channel Material Device in Semiconductor Process and Equipment Development by CMOS Manufacturing Technology
- 微波電漿化學氣相沉積系統製作混合碳奈米纖維／碳化矽錐形奈米結構 Fabrication of Cone-Shaped CNF/SiC-Coated Si-Nanocone Structures by Microwave Plasma Chemical Vapour Deposition
- 感應耦合電漿離子蝕刻技術應用於3D IC玻璃穿孔導線封裝研究 Investigation of Fabricated Through Glass Via(TGV) Process by Inductively Coupled Plasma Reactive Ion Etching(ICP-RIE) for 3D-IC Package Applications
- 金奈米樹枝晶叢林應用於可見光增強甲醇氧化反應 Gold Dendritic Nano-Forests for Visible-Light-Enhanced Methanol Oxidation Reaction
- 台灣光子源開創未來的光 Lighting the Way to a Better Tomorrow
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