| 英文摘要 |
Recently, complex oxide thin films have caught a lot of attention. They are known to possess rich physical properties with great potential to be commercially used. In order to bring complex oxides into practical application, heteroepitaxy was introduced and has been a widely adopted method to develop complex oxide thin films. However, due to the lattice mismatch, the chosen of a suitable substrate became a crucial issue and has hinder the development of oxide heteroepitaxy. To integrate complex oxide into commercial devices, freestanding membrane was proposed. With a sacrificial layer, freestanding thin film can be detached from the original substrate. Traditionally, La0.7Sr0.3MnO3 and Sr3Al2O6 are two common materials adopted as sacrificial layers. By etching the sacrificial layer, the thin film which was deposited on the sacrificial layer can be separated from the substrate. In this work, we proposed an alternative choice of the sacrificial layer, YBa2Cu3O7-x, which can be etched in a very short period, allowing the fabrication of high-quality freestanding thin films. Furthermore, such approach allows us to separate materials which is sensitive to acid etchant such as La0.7Sr0.3MnO3 because the etching time of YBa2Cu3O7-x is much faster than La0.7Sr0.3MnO3. Our goal is to develop a distinct method that could be a universal way to deliver freestanding thin films. |