Characterization of the LCD Alignment Layer Grown by an Oblique Evaporation System

This study attempts to alter the film surface roughness and angle of the elongated columnar structure through evaporating silicon dioxide (SiO2) depositing in a particular angle onto the indium-tin oxide (ITO) substrate. The alteration of this developed structure could help to improve the alignment of liquid crystal (LC), a method that not only serves to improve the shortcoming of the contact method but the oblique evaporation also provides an opportunity to reinvent a known technology into a new generation aligned technology.