以五環素為主動層之有機薄膜電晶體研究

本篇文章最主要著眼於有機薄膜電晶體的製作與改良，利用不同的方法來改善有機主動層品質，進而促進有機薄膜電晶體的電特性。在這個報告之中，我們採用原子力顯微鏡與X光繞射光譜來衡量有機層結晶性的改善程度，並且利用這些資料與有機薄膜電晶體的場效載子移動率來做整體實驗的評估。

In this report, the fabrication and modification of organic thin-film transistors (OTFT) were mentioned. We focused on enhancing the quality of organic active layers and then obtained the better performance OTFTs. Atomic force microscope (AFM) and X-ray diffraction were used to check the quality of organic layers. Moreover, the mobility of the OTFT was the key parameter utilized in this report for determine if OTFT performed good or not.