Nowadays, how to make the face recognition faster and more accurate is one of the pursuing targets in this field. The target can be achieved through a local significant feature and effectively reducing the number of comparisons. Currently, most of the face recognition methods are used to extract the features of the entire face image, and through one-by-one comparisons with the images in the database to obtain final results. In this study, a screening technique is proposed that can effectively improve the defects of over-compared features and excessive comparing times. In order to design this screening technology, the influence of locally significant features on the recognition rate is explored by using variance analysis to obtain the optimal screening technology process. The studied results show that to compare with the current methods, the proposed technology not only can maintain the same recognition rate, but also can improve the recognition efficiencies upon 115.5% and 52.9% on the recognition time subject to the face databases of Extended Yale Face Database B and MECL, respectively.