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篇名
Determining the Optimum Process Mean for the Larger-the Better Weibull Quality Characteristic
作者 Chen, Chung-ho
中文摘要
In Cho and Leonard’s piecewise linear loss function for the larger-the-better quality characteristic, the quality loss is positively and linearly proportional to the deviation from the lower specification limit (LSL) when the quality characteristic is less than the LSL. The quality loss is equal to zero when the quality characteristic is greater than or equal to the LSL. However, the quality loss should be equal to zero when the value of quality characteristic approaches infinity for the larger-the-better characteristic. In this paper, we modify Cho and Leonard’s piecewise linear loss function for measuring the product quality and determine the optimum process mean.Assuming that the quality characteristic follows a Weibull distribution and is larger-the-better, the application of determining the optimum process mean for the modified Cho and Leonard’s model with piecewise linear loss function is discussed.
起訖頁 172-176
關鍵詞 Piecewise linear loss functionProcess meanProcess standard deviationWeibull distribution
刊名 國際應用科學與工程學刊  
期數 200309 (1:2期)
出版單位 朝陽科技大學理工學院
該期刊-上一篇 Fast Discretet Wavelet Transformation Using FPGAs and Distributed Arithmetic
 

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